SMALL-ANGLE X-RAY-DIFFRACTION STUDIES ON INTERFACE SHARPNESS OF AMORPHOUS SE CDSE SUPERLATTICES/

X-ray diffraction measurements have been performed to evaluate the int erface sharpness of Se/CdSe amorphous multilayers as well as their the rmal stability. A value of about 1.6 nm has been measured as the effec tive interface thickness, d(i). It decreased to d(i) approximate to 1. 3 nm after the samples were annealed at an optimum temperature, T-a ap proximate to 360 K. A negative interdiffusion coefficient has been obt ained in this case. More complicated temperature dependences of the X- ray diffraction peaks have been observed at higher annealing temperatu res. Two different thermally dependent processes have been considered.