ELECTROSTATIC DISCHARGE DAMAGE OF MR HEADS

Authors
TIAN H LEE JJK
Citation
H. Tian et Jjk. Lee, ELECTROSTATIC DISCHARGE DAMAGE OF MR HEADS, IEEE transactions on magnetics, 31(6), 1995, pp. 2624-2626
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
31
Issue
6
Year of publication
1995
Part
1
Pages
2624 - 2626
Database
ISI
SICI code
0018-9464(1995)31:6<2624:EDDOMH>2.0.ZU;2-8
Abstract
Two mechanisms of ESD damage of MR heads, electrothermal damage of NIR sensors and dielectric breakdown of MR shields, were investigated, Ex perimental results of temperature rise within the MR sensors agree wel l with theoretical predictions.