HIGH-RESOLUTION ELECTRON-MICROSCOPY AND NANO-PROBE STUDY OF COSM /CR FILMS/

The crystal structure of the crystallites in CoSm thin films deposited on Cr underlayer was studied by nanodiffraction and high resolution e lectron microscopy (HREM). It was found that the crystallites have a d osed-packed structure, Some nanodiffraction patterns taken from differ ent crystallites using a two nanometer probe can be indexed by two lay er stacking AB (HCP structure), three layer stacking ABC (FCC structur e), and four layer stacking ABAC (double hexagonal structure), suggest ing that a particular local stacking mode could exist, [11 (2) over ba r 0] HREM images confirmed that the stacking sequence changes within o ne crystallite, In local regions, random stacking, and unit cells of t wo layer stacking AB, three layer stacking ABC, and four layer stackin g ABAC were found.