MICROMAGNETIC AND EXPERIMENTAL STUDIES OF COPTCR POLYCRYSTALLINE THIN-FILM MEDIA WITH BICRYSTAL MICROSTRUCTURE

Polycrystalline CoPtCr/CrV(or Cr) thin films with different Cr concent rations were prepared by sputter deposition on NiP-plated Al substrate s. TEM images revealed the existence of bicrystal clusters. High field torque measurement was used to determine the intrinsic anisotropy con stant. The M-H loop and torque hysteresis measurement coupled with mic romagnetic modeling permitted determination of intergranular interacti ons. The cross-track correlation length was evaluated from micromagnet ic noise calculation and compared well with the result from measured n oise spectra. The physical implication of a bicrystal structure is dis cussed in general.