A SOFT ERROR RATE TRACK DENSITY MODEL FOR MR HEADS

Citation
K. Wiesen et al., A SOFT ERROR RATE TRACK DENSITY MODEL FOR MR HEADS, IEEE transactions on magnetics, 31(6), 1995, pp. 3066-3068
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189464
Volume
31
Issue
6
Year of publication
1995
Part
1
Pages
3066 - 3068
Database
ISI
SICI code
0018-9464(1995)31:6<3066:ASERTD>2.0.ZU;2-P
Abstract
The calculation of soft error rate from models of the disk, head, and channel is used to predict optimum read and write widths for MR heads. For a 4.3 mu m track pitch, 120 kfci, and PR4 coding, the best write width is 3.8 mu m and the best read width is 2.9 mu m. The optimum wri te width is relatively insensitive to track misregistration and read a nd write width process variations. The optimum read width decreases wi th increasing track misregistration. The soft error rate is most sensi tive to write-to-write track misregistration.