Y. Xiao et al., THE EFFECT OF PD LAYER THICKNESS ON THE MAGNETIC AND MAGNETOOPTICAL PROPERTIES OF PD (PT/CO/PT) MODULATED MULTILAYERS/, IEEE transactions on magnetics, 31(6), 1995, pp. 3343-3345
A series of Pd-t(Pd)/(Pt-2 Angstrom/Co-3 Angstrom/Pt-2 Angstrom) modul
ated multilayer films with Pd layer thickness t(Pd) ranging from 3 to
12 Angstrom have been deposited on oxidized Si substrates, SQUID magne
tic and Kerr hysteresis loop measurements reveal that large magnetic m
oment and Kerr rotation is achieved in the multilayers wit:h Pd layer
thicknesses less than 6 Angstrom. This result, and X-ray diffraction d
ata suggest that the Pd layer thickness strongly affects the magnitude
of the induced magnetic moment and Kerr rotation as well as the sharp
ness of the interfaces of Pd/(Pt/Co/Pt) multilayers. A Kerr rotation o
f 0.3 degrees is observed near 400 nm in the multilayer film with t(Pd
) of 6 Angstrom. The multilayers with t(Pd) of 6 to 12 Angstrom exhibi
t perpendicular magnetic anisotropy energies as high as 7x10(7) erg/cm
(3).