ATOMIC-FORCE MICROSCOPY IMAGING OF VISCOELASTIC PROPERTIES IN TOUGHENED POLYPROPYLENE RESINS

Citation
B. Nysten et al., ATOMIC-FORCE MICROSCOPY IMAGING OF VISCOELASTIC PROPERTIES IN TOUGHENED POLYPROPYLENE RESINS, Journal of applied physics, 78(10), 1995, pp. 5953-5958
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
10
Year of publication
1995
Pages
5953 - 5958
Database
ISI
SICI code
0021-8979(1995)78:10<5953:AMIOVP>2.0.ZU;2-6
Abstract
The bulk morphology of two toughened polypropylene/(ethylene propylene )copolymer resins (PP/EP) presenting different impact resistances has been studied by means of different atomic force microscopy techniques: contact atomic force microscopy, lateral force microscopy (LFM), and force modulation microscopy (FMM). The three techniques reveal two dif ferent morphologies as observed in transmission electronic microscopy. In LFM, a higher friction force is observed on the rubbery phase whic h has the lower Young's modulus confirming the relationship between fr iction force and elastic properties. In force modulation, the elastic moduli is found to be much lower on the EP nodules in both resins. FMM also reveals that the difference of viscous response between the PP m atrix and the EP nodules is much lower in the resin which is less impa ct resistant. (C) 1995 American Institute of Physics.