C. Hubschmid et al., XPS AND AES ANALYSIS OF PASSIVE FILMS ON FE-25CR-X (X=MO, V, SI AND NB) MODEL ALLOYS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 234-239
Corrosion resistance of stainless steel is due to the presence of a th
in passive film of typically 1-2 nm thickness. The influence of ternar
y alloying elements on the composition of passive films on Fe-Cr alloy
s and their pitting corrosion resistance has been investigated. Iron-c
hromium alloys were analyzed by XPS and AES with model alloys (Fe-25Cr
-X with X = at % Mo, Si, V and Nb) formed in sulphate solution in the
presence and absence of chloride ions. All ternary alloying elements i
ncrease the pitting potential compared to the corresponding binary all
oy. Films formed in chloride containing sulphate solution contain both
electrolyte anions. Scanning Auger microscopy reveals that for a two
phase system such as Fe-25Cr-11Nb, the dendritic phase is enriched wit
h chromium, while essentially all of the niobium is located in the int
erdendritic eutectic.