XPS STUDIES OF THIN POLYCYANURATE FILMS ON SILICON-WAFERS

Authors
DIECKHOFF S SCHLETT V POSSART W HENNEMANN OD
Citation
S. Dieckhoff et al., XPS STUDIES OF THIN POLYCYANURATE FILMS ON SILICON-WAFERS, Fresenius' journal of analytical chemistry, 353(3-4), 1995, pp. 278-281
Citations number
10
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
353
Issue
3-4
Year of publication
1995
Pages
278 - 281
Database
ISI
SICI code
0937-0633(1995)353:3-4<278:XSOTPF>2.0.ZU;2-L
Abstract
Thin films of a diandicyanato bisphenol A (DCBA) prepolymer on silicon substrates have been investigated. Angle dependent X-ray photoelectro n spectroscopy reveals some thickness-dependent features, which lead t o an adsorption model for the DCBA prepolymer molecules. The adsorptio n of the first layer is governed by the interaction of the triazine ri ngs with the substrate surface.