COMPARATIVE-STUDIES OF MCS(-SIMS AND E(-)-BEAM SNMS FOR QUANTITATIVE-ANALYSIS OF BULK MATERIALS AND LAYERED STRUCTURES())

For the quantification of heterostructure depth profiles the knowledge of relative sensitivity factors (RSF) and the influence of matrix eff ects on the measured profiles is necessary. Matrix dependencies of the measured ion intensities have been investigated for sputtered neutral mass spectrometry (SNMS) and MCs(+)-SIMS. The use of Cs as primary io ns for SNMS is advantageous compared to Ar because the depth resolutio n is improved without changing RSFs determined under Ar bombardment. N o significant amount of molecules has been found in the SNMS spectra u nder Cs bombardment. Using MCs(+)-SIMS the RSFs are matrix dependent. An improvement of depth resolution can be achieved by biasing the samp le against the primary ion beam for SNMS due to a reduction of the net energy of the primary ions and a resulting more gracing impact angle.