STRUCTURAL CHARACTERIZATION OF FE-N FILMS PREPARED BY LASER-ABLATION

Authors
YOSHITAKE T OHKOSHI M
Citation
T. Yoshitake et M. Ohkoshi, STRUCTURAL CHARACTERIZATION OF FE-N FILMS PREPARED BY LASER-ABLATION, IEEE transactions on magnetics, 31(6), 1995, pp. 3850-3852
Citations number
17
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
31
Issue
6
Year of publication
1995
Part
2
Pages
3850 - 3852
Database
ISI
SICI code
0018-9464(1995)31:6<3850:SCOFFP>2.0.ZU;2-N
Abstract
Fe-N films were deposited on glass substrates at temperatures between 20 and 250 degrees C in a wide range of nitrogen pressure by KrF excim er laser ablation. Magnetic properties of the Fe-N films are discussed associated with the film structure. Saturation magnetization over 200 0 emu/cm(3) with a decreased coercivity is observed in bct Fe-N films with high crystal orientation prepared at a substrate temperature of 2 50 degrees C.