Magnetic properties and domain structure were investigated for die-dra
wn and subsequently annealed Fe-Si-B amorphous wires. It was found tha
t the die-drawn wire has bamboo domain similar to that of the Co based
wire with negative magnetostriction and looses the re-entrant flux re
versal characteristic. It was also found that the wire recovers the re
-entrant characteristic after annealing. The tension-annealed wire has
clear shell and core domain structure and exhibits the re entrant cha
racteristic with enhanced remanence. The surface bamboo domain layer a
s thin as 5 mu m was connected to the core domain by magnetization tha
t changes direction continuously between two domains without domain wa
ll. From the temperature dependence of a threshold field for the disco
ntinuous flux jump, it is inferred that the re entrant characteristic
is caused by the depinning of the reverse domain existing near the wir
e end due to demagnetizing effect.