RAMAN-STUDY OF TETRAGONAL TUNGSTEN DISILICIDE

Citation
O. Chaixpluchery et al., RAMAN-STUDY OF TETRAGONAL TUNGSTEN DISILICIDE, Applied surface science, 91(1-4), 1995, pp. 68-71
Citations number
11
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
91
Issue
1-4
Year of publication
1995
Pages
68 - 71
Database
ISI
SICI code
0169-4332(1995)91:1-4<68:ROTTD>2.0.ZU;2-#
Abstract
After a brief report of recent WSi2 Raman results on the band assignme nt and thermal behavior of the WSi2 lines obtained for both a single c rystal and a thin film, a calculation of vibrational frequencies and n ormal coordinates at the zone center is presented. The first results s how good agreement between observed and calculated frequencies, and co nfirm our previous description of vibrational modes, The corresponding force constants relative to Si-Si and W-Si bonds are found to be diff erent while the bond lengths are very close. The present results will be used in future calculations at the zone boundary.