INVESTIGATION OF THE RADIATION-INDUCED CHANGES ON THE SURFACE-TOPOLOGY OF PVC FILMS BY ATOMIC-FORCE MICROSCOPY

Authors
TAN E ALACAKIR A UZUN C GUVEN O
Citation
E. Tan et al., INVESTIGATION OF THE RADIATION-INDUCED CHANGES ON THE SURFACE-TOPOLOGY OF PVC FILMS BY ATOMIC-FORCE MICROSCOPY, Radiation physics and chemistry, 46(4-6), 1995, pp. 897-900
Citations number
4
Categorie Soggetti
Nuclear Sciences & Tecnology","Chemistry Physical","Physics, Atomic, Molecular & Chemical
Journal title
Radiation physics and chemistry → ACNP
ISSN journal
0969806X
Volume
46
Issue
4-6
Year of publication
1995
Part
1
Pages
897 - 900
Database
ISI
SICI code
0969-806X(1995)46:4-6<897:IOTRCO>2.0.ZU;2-8
Abstract
Surface analysis of polymers which are widely used in our daily life a nd many research areas, is of primary importance for better understand ing of their stabilities against various external effects. Thus in con junction with this, Atomic Force Microscopy (AFM) was used to determin e the surface topology of the gamma irradiated poly(vinyl chloride) (P VC)films. The films prepared by solvent casting were irradiated with v arious doses up to 237 kGy by Co-60 gamma rays at a dose rate of 15 kG y/h at ambient temperature in air and vacuum. Three dimensional surfac e topological images of the films have been obtained by AFM for both u nirradiated and irradiated samples.