FREE-ION YIELD AND ELECTRON-ION RECOMBINATION RATE IN LIQUID XENON

A recently proposed re-encounter model for free-ion yield at low-LET i s applied to liquid xenon. For an initial electron-ion separation give n by the thermalization distance (approximate to 4000-5000 nm), good a greement with measured escape probability is obtained for an encounter recombination probability approximate to 0.01-0.03. Analysis of homog eneous recombination at low external fields places the electron-ion re combination rate in the range of (4.0-8.5) x 10(15) M(-1) s(-1).