SPECIAL ISSUE ON PARTIAL SCAN METHODS

Authors
AGRAWAL VD
Citation
Vd. Agrawal, SPECIAL ISSUE ON PARTIAL SCAN METHODS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 7(1-2), 1995, pp. 5-6
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS → ACNP
ISSN journal
09238174
Volume
7
Issue
1-2
Year of publication
1995
Pages
5 - 6
Database
ISI
SICI code
0923-8174(1995)7:1-2<5:SIOPSM>2.0.ZU;2-L