St. Chakradhar et al., AN EXACT ALGORITHM FOR SELECTING PARTIAL SCAN FLIP-FLOPS, JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 7(1-2), 1995, pp. 83-93
We develop an exact algorithm for selecting partial scan Aip-flops to
break all feedback cycles. We also permit the option of not breaking s
elf-loops. The key ideas that allow us to solve this complex problem e
xactly for large, practical instances are-an MFVS-preserving graph tra
nsformation, a partitioning scheme used in the branch and bound proced
ure, and pruning techniques based on an integer linear programming for
mulation of the MFVS problem. We have obtained optimum solutions for a
ll ISCAS'89 benchmark circuits and several production VLSI circuits wi
thin reasonable computation time, For example, the optimal number of s
can flip-flops required to eliminate all cycles except self-loops in t
he circuit s38417 is 374. An optimal solution was obtained in 32 CPU s
econds on a SUN Sparc 2 workstation.