PEAK FITTING OF THE CHROMIUM 2P XPS SPECTRUM

Citation
Am. Salvi et al., PEAK FITTING OF THE CHROMIUM 2P XPS SPECTRUM, Applied surface science, 90(3), 1995, pp. 333-341
Citations number
17
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
90
Issue
3
Year of publication
1995
Pages
333 - 341
Database
ISI
SICI code
0169-4332(1995)90:3<333:PFOTC2>2.0.ZU;2-3
Abstract
An XPS investigation of loss feature and peak shape analysis of the ch romium 2p region has been performed. The approach is based on the use of a modified Shirley background model and requires the estimation of an individual background for each component of the photopeak under exa mination. The results obtained from the analysis of clean and oxidised chromium metal and pure Cr2O3, notwithstanding possible shortcomings in the model, give evidence for the importance of a proper considerati on of satellite structures in the peak synthesis of Cr 2p XPS spectra. The results also have important ramifications in the peak fitting of the 2p spectra of other d-band transition metals such as manganese, ir on and cobalt.