XPS OXYGEN LINE BROADENING IN LEAD ZIRCONIUM TITANATE AND RELATED MATERIALS

Citation
A. Zomorrodian et al., XPS OXYGEN LINE BROADENING IN LEAD ZIRCONIUM TITANATE AND RELATED MATERIALS, Applied surface science, 90(3), 1995, pp. 343-348
Citations number
23
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
90
Issue
3
Year of publication
1995
Pages
343 - 348
Database
ISI
SICI code
0169-4332(1995)90:3<343:XOLBIL>2.0.ZU;2-X
Abstract
Synthesis of the Pb(ZrxTi1-x)O-3 (PZT) ceramics requires mixing materi als such as PbO, TiO2 and ZrO2. X-ray photoelectron spectroscopy (XPS) of PZT thin films and other Ph-based materials shows structure and li neshape changes in the O1s line which can be described in term of the shifts in binding energies of O1s electrons in their constituents. The hybridization and overlap of the density of states of the elements in the molecule result in softening the bonds, shifting the oxygen peak toward a lower binding energy. Other lead-based materials such as PbZr O3 (PZO) and PbTiO3 (PTO), which also contain the same species, have b een studied for comparison. The results show similar behavior of the o xygen peaks to that in PZT.