SURFACE CHARACTERIZATION OF METHYL METHACRYLATE-POLY(ETHYLENE GLYCOL)METHACRYLATE COPOLYMERS BY SECONDARY-ION MASS-SPECTROMETRY AND X-RAY PHOTOELECTRON-SPECTROSCOPY

Surface analysis of methyl methacrylate/poly(ethylene glycol) methacry late copolymers has been carried out using X-ray photoelectron spectro scopy (XPS) and static secondary ion mass spectrometry (SSIMS). Both t echniques confirm that solvent-cast films of these random copolymers p resent a surface that is very similar in composition to the bulk. A sl ight excess of methyl methacrylate units at the polymer/ vacuum interf ace was noted in the XPS spectra. SSIMS reveals that the top few monol ayers of the copolymer films are typical of the bulk material and also confirm the presence of a methoxy end cap in the poly(ethylene glycol ) methacrylate macromonomer structure.