A NEW CAPACITOR TECHNOLOGY-BASED ON POROUS SILICON

Citation
V. Lehmann et al., A NEW CAPACITOR TECHNOLOGY-BASED ON POROUS SILICON, Solid state technology, 38(11), 1995, pp. 99
Citations number
7
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied","Physics, Condensed Matter
Journal title
ISSN journal
0038111X
Volume
38
Issue
11
Year of publication
1995
Database
ISI
SICI code
0038-111X(1995)38:11<99:ANCTOP>2.0.ZU;2-H
Abstract
Standard microelectronic fabrication techniques have been used to make a capacitor based on an electrochemically etched macroporous silicon substrate and a layered dielectric. This solid-state technology allows a specific capacitance value that can only be reached by electrolytic capacitors. The dependence of the capacitance on temperature, frequen cy, applied bias, and time of operation was compared to other capacito r technologies. This capacitor is fully compatible with surface mounte d device (SMD) and multichip module (MCM) technologies.