CU CVD FROM COPPER(II) HEXAFLUOROACETYLACETONATE .1. A COLD-WALL REACTOR DESIGN, BLANKET GROWTH-RATE, AND NATURAL SELECTIVITY

Citation
Yd. Chen et al., CU CVD FROM COPPER(II) HEXAFLUOROACETYLACETONATE .1. A COLD-WALL REACTOR DESIGN, BLANKET GROWTH-RATE, AND NATURAL SELECTIVITY, Journal of the Electrochemical Society, 142(11), 1995, pp. 3903-3911
Citations number
29
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
142
Issue
11
Year of publication
1995
Pages
3903 - 3911
Database
ISI
SICI code
0013-4651(1995)142:11<3903:CCFCH.>2.0.ZU;2-H
Abstract
An atmospheric pressure cold wall reactor was designed and built for t he purpose of studying the thermal decomposition of Cu(hfa)(2) as a re pair technique for broken copper interconnection lines, using thermall y biased substrates, and a laser to heat localized areas to a temperat ure appropriate for the deposition of pure copper. In this paper, a di scussion of the design is presented, and theoretical and experimental blanket copper deposition growth rates in argon and forming gas are di scussed. The primary goals of the present work were the design of the system, the determination of blanket growth rate characteristics, and examination of the tendency for ''natural selectivity'' to occur on tw o contiguous dielectric materials, SiO2 and polyimide. In studies of n atural selectivity, deposition was observed on SiO2, but not on contig uous polyimide at substrate temperatures of 340 degrees C down to 270 degrees C or lower, using argon as a carrier/diluent, and from 270 deg rees C down to 150 degrees C, using argon/hydrogen mixtures (9:1) as a carrier/diluent.