Yd. Chen et al., CU CVD FROM COPPER(II) HEXAFLUOROACETYLACETONATE .1. A COLD-WALL REACTOR DESIGN, BLANKET GROWTH-RATE, AND NATURAL SELECTIVITY, Journal of the Electrochemical Society, 142(11), 1995, pp. 3903-3911
An atmospheric pressure cold wall reactor was designed and built for t
he purpose of studying the thermal decomposition of Cu(hfa)(2) as a re
pair technique for broken copper interconnection lines, using thermall
y biased substrates, and a laser to heat localized areas to a temperat
ure appropriate for the deposition of pure copper. In this paper, a di
scussion of the design is presented, and theoretical and experimental
blanket copper deposition growth rates in argon and forming gas are di
scussed. The primary goals of the present work were the design of the
system, the determination of blanket growth rate characteristics, and
examination of the tendency for ''natural selectivity'' to occur on tw
o contiguous dielectric materials, SiO2 and polyimide. In studies of n
atural selectivity, deposition was observed on SiO2, but not on contig
uous polyimide at substrate temperatures of 340 degrees C down to 270
degrees C or lower, using argon as a carrier/diluent, and from 270 deg
rees C down to 150 degrees C, using argon/hydrogen mixtures (9:1) as a
carrier/diluent.