Ak. Ray et R. Nandakumar, SIMULTANEOUS DETERMINATION OF SIZE AND WAVELENGTH-DEPENDENT REFRACTIVE-INDEXES OF THIN-LAYERED DROPLETS FROM OPTICAL RESONANCES, Applied optics, 34(33), 1995, pp. 7759-7770
A technique for determining the size and wavelength-dependent refracti
ve indices of a droplet coated with a thin layer is presented. The exi
stence of a layer on the droplet is identified by a procedure that inv
olves separate alignments of independently measured TE- and TM-mode re
sonances with computed homogeneous- procedure also yields the mode and
the order numbers associated with The observed resonances are then al
igned with layered-sphere resonances of the same mode and order number
s to determine the core radius, layer thickness, and constants of core
acid shell dispersion formulas that minimize the difference between t
he observed and the calculated positions of resonances. The technique
has been tested with synthetic data with various levels of random erro
rs as well as with experimental data from two droplets under identical
conditions. The results show that the core radius, layer thickness, a
nd core and layer refractive indices can be determined with relative e
rrors of 3.5 x 10(-4), 4.5 x 10(-2), 2.3 x 10(-4), and 4.4 x 10(-3), r
espectively, with the technique. (C) 1995 Optical Society of America