MAGNETIC-FIELD DEPENDENCE OF CYCLOTRON-RESONANCE LINEWIDTHS IN GE ANDSI BY A PROJECTION TECHNIQUE

The magnetic field dependence of cyclotron resonance linewidths is exa mined theoretically on the basis of the projection technique. It is sh own that in the quantum limit of pure Ge and Si the widths increase wi th the magnetic field, and the result for Ge agrees quite well with th e existing experimental data.