MICROSTRUCTURAL INVESTIGATION OF AS-DEPOSITED NANO-GRANULAR CO-AG FILMS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY

Authors
DU JH LI Q WANG LC SANG H ZHANG SY DU YW FENG D
Citation
Jh. Du et al., MICROSTRUCTURAL INVESTIGATION OF AS-DEPOSITED NANO-GRANULAR CO-AG FILMS BY HIGH-RESOLUTION ELECTRON-MICROSCOPY, Physica status solidi. a, Applied research, 151(2), 1995, pp. 313-317
Citations number
10
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
151
Issue
2
Year of publication
1995
Pages
313 - 317
Database
ISI
SICI code
0031-8965(1995)151:2<313:MIOANC>2.0.ZU;2-#
Abstract
The microstructure of as-deposited granular Co-Ag thin films is invest igated by high resolution electron microscopy. Our results suggest tha t the thin films consist of two separate phases. The crystallized Co p articles, with nonuniform size and preferential lattice orientations [ 110], [111], [112], [100] in the direction of the him surface normal, are directly observed. There is a tendency that two connecting grains have two groups of parallel lattice planes.