The grain boundary regions of nanophase Cu metal are investigated usin
g the x-ray absorption fine structure (XAFS) technique. Typical sample
s made by standard techniques need to be greatly thinned if measured i
n transmission in order to eliminate experimental artifacts which erro
neously lower the apparent coordination number. To avoid this problem
the samples were measured by the total electron yield technique. The r
esults indicate a grain boundary structure which, on the average, is s
imilar to that in conventional polycrystalline Cu, contrary to previou
s XAFS measurements made in transmission which indicated a lower coord
ination number.