Y. Suzuki et al., DISCRIMINATIVE IMAGING OF LOCAL CRYSTALLINE DENSITY AND THICKNESS VARIATION IN STRAINED NATURAL-RUBBER BY SPECTROSCOPIC X-RAY-SCATTERING TOPOGRAPHY, JPN J A P 2, 34(11A), 1995, pp. 1503-1505
X-ray spectroscopic scattering topography using an energy dispersive s
olid state detector has been applied to discriminate a local crystalli
zation effect from the influence of thickness variation in strained na
tural rubber. ZnK alpha . X-rays which are emitted from the zinc oxide
additive are selected in the multichannel spectra to provide a thickn
ess distribution map in the specimen. With appropriate calibration we
could measure the distribution of thickness quantitatively, while X-ra
ys with a longer wavelength than ZnK alpha are employed to form the X-
ray topograph indicating the degree of crystallization.