DISCRIMINATIVE IMAGING OF LOCAL CRYSTALLINE DENSITY AND THICKNESS VARIATION IN STRAINED NATURAL-RUBBER BY SPECTROSCOPIC X-RAY-SCATTERING TOPOGRAPHY

X-ray spectroscopic scattering topography using an energy dispersive s olid state detector has been applied to discriminate a local crystalli zation effect from the influence of thickness variation in strained na tural rubber. ZnK alpha . X-rays which are emitted from the zinc oxide additive are selected in the multichannel spectra to provide a thickn ess distribution map in the specimen. With appropriate calibration we could measure the distribution of thickness quantitatively, while X-ra ys with a longer wavelength than ZnK alpha are employed to form the X- ray topograph indicating the degree of crystallization.