The structure of diamond films grown from a methane and hydrogen gas m
ixture by chemical vapor deposition (microwave plasma and hot-filament
methods) has been studied with particular attention to the structure
of substrate-interface. By examining the diamond films deposited on ei
ther Si or Mo by scanning and transmission electron microscopies, elec
tron diffraction, and energy dispersive X-ray (EDX) micro-analysis (in
-situ), it was found that there is an intermediate layer composed of a
morphous carbon and fine particles of face-centered cubic (fcc) carbon
between the employed substrate and the deposited diamond film in both
cases of Si and Mo. The fine particles of carbon give rise to electro
n diffraction rings which satisfy the extinction rule of fcc. The obta
ined lattice constant is very close to that of SiC which has a similar
extinction rule. However, the fcc carbon and SiC are discernible by e
xamining the intensities of their 200 rings of electron diffraction. I
t appears that the fcc carbon plays an important role in the diamond n
ucleation.