X-RAY AND TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF IMPERFECT GEXSI1-X SI STRAINED-LAYER SUPERLATTICES/

Authors
LI JH DUAN XF MAI ZH CUI SF
Citation
Jh. Li et al., X-RAY AND TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF IMPERFECT GEXSI1-X SI STRAINED-LAYER SUPERLATTICES/, Journal of materials science letters, 12(19), 1993, pp. 1511-1513
Citations number
11
Categorie Soggetti
Material Science
Journal title
Journal of materials science letters → ACNP
ISSN journal
02618028
Volume
12
Issue
19
Year of publication
1993
Pages
1511 - 1513
Database
ISI
SICI code
0261-8028(1993)12:19<1511:XATEAO>2.0.ZU;2-#