Most electrochemical applications of ellipsometry are dynamic in natur
e, and this has meant that monochromatic ellipsometry is to date the d
ominant mode of operation. When measurements can be made in situ, elli
psometry is a powerful and versatile diagnostic tool, and this paper h
ighlights a number of diverse applications to support this view. Examp
les are given of the kinetics of growth of thick, uniform films, films
with a strong gradient of density, very thin films, and nucleating su
rfaces. Some of the problems that can be met in interpreting ellipsome
tric results are indicated, with solutions where available. Other opti
cal techniques which can be used as useful adjuncts to ellipsometry ar
e also mentioned.