ELLIPSOMETRY IN ELECTROCHEMISTRY - A SPECTRUM OF APPLICATIONS

Authors
Citation
R. Greef, ELLIPSOMETRY IN ELECTROCHEMISTRY - A SPECTRUM OF APPLICATIONS, Thin solid films, 233(1-2), 1993, pp. 32-39
Citations number
40
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
233
Issue
1-2
Year of publication
1993
Pages
32 - 39
Database
ISI
SICI code
0040-6090(1993)233:1-2<32:EIE-AS>2.0.ZU;2-F
Abstract
Most electrochemical applications of ellipsometry are dynamic in natur e, and this has meant that monochromatic ellipsometry is to date the d ominant mode of operation. When measurements can be made in situ, elli psometry is a powerful and versatile diagnostic tool, and this paper h ighlights a number of diverse applications to support this view. Examp les are given of the kinetics of growth of thick, uniform films, films with a strong gradient of density, very thin films, and nucleating su rfaces. Some of the problems that can be met in interpreting ellipsome tric results are indicated, with solutions where available. Other opti cal techniques which can be used as useful adjuncts to ellipsometry ar e also mentioned.