X-RAY AND MICRO-RAMAN ANALYSIS OF NANOPHASE ZRO2 AND Y2O3-ZRO2 PRODUCED BY THE GAS-PHASE CONDENSATION TECHNIQUE

Citation
Cm. Foster et al., X-RAY AND MICRO-RAMAN ANALYSIS OF NANOPHASE ZRO2 AND Y2O3-ZRO2 PRODUCED BY THE GAS-PHASE CONDENSATION TECHNIQUE, Journal of materials research, 8(8), 1993, pp. 1977-1982
Citations number
14
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
8
Issue
8
Year of publication
1993
Pages
1977 - 1982
Database
ISI
SICI code
0884-2914(1993)8:8<1977:XAMAON>2.0.ZU;2-N
Abstract
Nanophase (n-) ZrO2 was produced in its pure and partially stabilized form by the gas-phase condensation method. The material was examined b y x-ray diffraction and Raman scattering to obtain information on the structural evolution of the material during sintering. Two types Of Y2 O3-doped ZrO2 nanophase material were made: one by co-deposition of n- Y2O3 and n-ZrO2 in a consecutive manner and the second by mechanically mixing n-Y2O3 and n-ZrO2. We have determined that the co-deposition p rocess is the most effective means of doping the n-ZrO2.