The simultaneous measurement of the spectrally and spatially variant t
ransmittance of a linear variable order-sorting filter in a manner tha
t closely resembles its conditions of actual use is described. The tra
nsmittance of a prototype order-sorting filter was measured in the 400
-to 880-nm wavelength region by illuminating it with the output beam o
f a spectrophotometer while the filter was attached to the front of a
30 x 32 pixel silicon array detector. The filter was designed to be us
ed in the output beam of a grating spectrometer to prevent the dispers
al of higher diffracted orders onto an array detector. Areas of the fi
lter that were spatially matched to the corresponding detector pixel c
olumn had measured peak transmittances of about 90% that were uniform
to within +/-1.5% along a given column. Transmittances for incident wa
velengths shorter than the desired bandpass, corresponding to the orde
r overlap region, were measured in the 3 x 10(-3) range. Line spread f
unction measurements made with the array detector indicated no signifi
cant beam spreading caused by inserting the filter into the beam.