CALCULATION OF AN UPPER LIMIT FOR AN EFFECTIVE FAST-ELECTRON DIFFUSION CONSTANT USING THE HARD X-RAY-CAMERA ON PBX-M

Citation
S. Jones et al., CALCULATION OF AN UPPER LIMIT FOR AN EFFECTIVE FAST-ELECTRON DIFFUSION CONSTANT USING THE HARD X-RAY-CAMERA ON PBX-M, Plasma physics and controlled fusion, 35(8), 1993, pp. 1003-1017
Citations number
22
Categorie Soggetti
Phsycs, Fluid & Plasmas
ISSN journal
07413335
Volume
35
Issue
8
Year of publication
1993
Pages
1003 - 1017
Database
ISI
SICI code
0741-3335(1993)35:8<1003:COAULF>2.0.ZU;2-6
Abstract
Fast electron localization and transport are important for tokamak cur rent profile control schemes. The hard x-ray camera on PBX-M produces two-dimensional, time resolved tangential images of fast electron brem sstrahlung, from which a fast electron diffusion constant is calculate d. Assuming a radially narrow lower hybrid power absorption profile, a momentum space absorption profile and a transport model [1], a model fast electron current density profile is calculated and compared to an experimentally derived profile, and the diffusion coefficient is adju sted until a good fit is found. Using this model, we compute an upper limit for an effective diffusion constant of D less-than-or-equal-to 1.1 m2/sec to within a factor of two.