Vv. Makarov, USE OF MODEL DEPTH RESOLUTION FUNCTIONS FOR THE DECONVOLUTION OF DEPTH PROFILING DATA, Surface and interface analysis, 20(10), 1993, pp. 821-826
The problem of deconvolution of SIMS depth profiles with model depth r
esolution function, which may differ from the true resolution function
, is considered. The concept of residual depth resolution function is
introduced to describe mathematically the result of the deconvolution.
The consequences of using a model depth resolution function of double
exponential form are explored and the range of exponents over which a
deconvolution might give useful information is derived analytically.
It is shown how a depth resolution function of double exponential form
distorts the initial profiles of different types. The analytical expr
essions are obtained for rectangular and exponential initial profiles.
It is shown that the convolution of the initial exponential profile w
ith a double exponential resolution function leads to a linear combina
tion of exponential functions containing separately either exponential
parameters of the resolution function or that of the initial profile.
The resultant inverse of the exponential slope cannot be calculated b
y direct summation of the characteristic lengths of the initial profil
e and those of the resolution function. The asymptotic behaviour of th
e convolution of the initial Gaussian profile with a double exponentia
l resolution function is explored analytically.