BUILT-IN SELF-TESTING OF COMMUNICATIONS-SYSTEMS USING ASIC TECHNOLOGY

Built-in self-test is a functional requirement that a complex electron ic system must satisfy in order to provide efficient production testin g and system maintenance. Effective solutions with minimum possible ha rdware overhead are needed. With the advent of application-specific in tegrated circuits, integration of functions conventionally performed b y external instrumentation in a single test IC on a board has become a reality. The paper gives an example of how advantage of user programm able logic was taken in the design of built-in self-test for telecommu nications equipment.