EXPERIMENTAL-EVIDENCE FOR N-15 CHARGE-CHANGE PROCESSES AT A LOW-ENERGY REGIME

We have measured the linewidths of the N-15 resonant nuclear reaction at 6.38 MeV on H bearing 1 to 10 nm thin films. By comparing the full width at half maximum values of the same film obtained by incident nit rogen ions of charge states 2+ and 3+ we have found evidence that the charge equilibration process takes place in less than 10 nm. This feat ure should be taken into account whenever films thinner than 10 nm are analyzed using the above mentioned reaction.