ELECTROOPTICAL CHARACTERIZATION OF PB(ZR,TI)O3 THIN-FILMS BY WAVE-GUIDE REFRACTOMETRY

Electric field-induced changes in the extraordinary and ordinary refra ctive indices of a Pb(Zr0.53Ti0.47)O3 thin film were independently det ermined using waveguide refractometry. Under an electric field, applie d normal to the film plane and corresponding to saturation of the elec tric polarization, the ratio of the extraordinary to ordinary refracti ve index change (DELTAn(e)/DELTAn(o)) is found to be -4/1, contributin g to a net birefringence change [DELTA(n(e)-n(o))] of -0.021. Using th is technique, both diagonal and off-diagonal elements of the electro-o ptic response tensor describing the macroscopic behavior of the polycr ystalline film were accessed, illustrating the importance of this appr oach in evaluating orientation-specific electro-optic characteristics in these films.