EFFECT OF HYDROGEN ON HOT-ELECTRON NOISE IN SHORT SAMPLES OF GAAS

Citation
V. Bareikis et al., EFFECT OF HYDROGEN ON HOT-ELECTRON NOISE IN SHORT SAMPLES OF GAAS, Semiconductor science and technology, 8(10), 1993, pp. 1829-1833
Citations number
23
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Condensed Matter","Material Science
ISSN journal
02681242
Volume
8
Issue
10
Year of publication
1993
Pages
1829 - 1833
Database
ISI
SICI code
0268-1242(1993)8:10<1829:EOHOHN>2.0.ZU;2-F
Abstract
We present experimental results on hot electron noise in untreated and hydrogenated samples of silicon-doped GaAs. Short n+-n-n+ structures are used to resolve noise sources arising from different mechanisms wh ich dominate electron scattering. Passivation of centres of impurity s cattering by hydrogen and the resultant effect on noise temperature an d spectral density of current fluctuations are clearly observed at int ermediate hydrogen doses (10(17) cm-2) low-field mobility of electrons increases, electron heating by electric field is favoured, noise sour ces due to GAMMA-L and GAMMA-X intervalley transfer and resonant scatt ering of hot electrons are better resolved, especially at low temperat ures. The effects at a hydrogen dose of 10(18) cm-2 suggest that the i mpurity passivation is accompanied by formation of new scattering cent res.