Hw. Brinkman et al., KINETICS OF THE EVD PROCESS FOR GROWING THIN ZIRCONIA YTTRIA FILMS ONPOROUS ALUMINA SUBSTRATES, Journal de physique. IV, 3(C3), 1993, pp. 59-66
The electrochemical vapour deposition (CVD/EVD) method has proven to b
e a good technique to form thin, gas tight dense solid electrolyte or
mixed conducting films on porous substrates. Applications of the so fo
rmed systems are in solid oxide fuel cells (SOFC), oxygen sensors, oxy
gen separation membranes and electrocatalytic reactors. In this paper,
experimental results on the kinetics of the deposition by the EVD met
hod of dense zirconia-yttria layers on porous alpha-alumina substrates
are presented, and compared with theoretical models. The experimental
work concerns mainly the effect of temperature on the growth rate of
the EVD film. At 1000-degrees-C, layer growth occurs linear with time
under current process conditions; in this case diffusion of the oxygen
source reactant in the substrate pores is the rate limiting step for
the EVD process. Between 900-degrees-C and 1000-degrees-C the growth r
ate limitation changes to the electrochemical transport through the fi
lm, which is parabolic with time. This behaviour is predicted by the t
heoretical model.