GROWTH-STUDIES AND PHYSICAL CHARACTERIZATIONS OF PB-SE-TE EPILAYERS GROWN BY HWE

Citation
A. Obadi et al., GROWTH-STUDIES AND PHYSICAL CHARACTERIZATIONS OF PB-SE-TE EPILAYERS GROWN BY HWE, Journal de physique. IV, 3(C3), 1993, pp. 139-145
Citations number
22
Categorie Soggetti
Physics
Journal title
ISSN journal
11554339
Volume
3
Issue
C3
Year of publication
1993
Pages
139 - 145
Database
ISI
SICI code
1155-4339(1993)3:C3<139:GAPCOP>2.0.ZU;2-K
Abstract
The deposition process of IV-VI semiconductors is studied in order to determine optimal conditions of evaporation. A thermodynamical model o f the growth is proposed and its use explained in HWE applications. Us ing these results, epitaxial thin films have been achieved on BaF2 and Si substrates in all the composition range from PbSe to PbTe. The epi layers obtained were then characterized by X-ray diffraction, Auger sp ectroscopy, SEM observations and electrical measurements. An optical s tudy from 4.2 to 300K is finally presented and the energy band gap dep endence versus composition and temperature has been established.