A SIMPLE IN-SITU CALIBRATION TECHNIQUE FOR SOFT-X-RAY FILM

Authors
LU PX FAN PZ XU ZZ LI RX WANG XF LI YL ZHANG ZQ CHEN SS
Citation
Px. Lu et al., A SIMPLE IN-SITU CALIBRATION TECHNIQUE FOR SOFT-X-RAY FILM, Review of scientific instruments, 64(10), 1993, pp. 2879-2882
Citations number
11
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
64
Issue
10
Year of publication
1993
Pages
2879 - 2882
Database
ISI
SICI code
0034-6748(1993)64:10<2879:ASICTF>2.0.ZU;2-1
Abstract
A simple valid in situ relative intensity calibration technique for so ft x-ray film is described. This is based on film exposure measurement s of the uniform line-shaped distributed soft x-ray monochromatic irra diation transmitted through a step-wedge absorption filter. Fitting th e calibration data with Henke's semiempirical equation for thick-emuls ion film, the characteristic curves for Shanghai 5F soft x-ray film wi thout supercoat (SIOM-5FW) have been obtained in the wavelength region from 50 to 80 angstrom.