NUCLEATION OF COPPER ON TIW AND TIN DURING CHEMICAL-VAPOR-DEPOSITION

Citation
Dh. Kim et al., NUCLEATION OF COPPER ON TIW AND TIN DURING CHEMICAL-VAPOR-DEPOSITION, Journal of applied physics, 74(8), 1993, pp. 5164-5166
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
74
Issue
8
Year of publication
1993
Pages
5164 - 5166
Database
ISI
SICI code
0021-8979(1993)74:8<5164:NOCOTA>2.0.ZU;2-X
Abstract
Copper grows as continuous films on various silicides and metals at su bstrate temperatures of 310-385-degrees-C, total pressures of 2-10 Tor r, and precursor vessel temperatures of 60-80-degrees-C (precursor mol e fractions of 0.004-0.35) with hydrogen using copper (II) hexafluoroa cetylacetonate [Cu(HFA)2] as the precursor. However, on TiW, TiW:N, an d TiN substrates, that were previously exposed to air, copper formed o nly small crystalline aggregates, not continuous films, perhaps becaus e of a thin surface layer of oxide. This conclusion was supported by A uger electron spectroscopy and scanning electron microscopy analyses.