A SHOCK-TRACKING ALGORITHM FOR SURFACE EVOLUTION UNDER REACTIVE-ION ETCHING

Citation
S. Hamaguchi et al., A SHOCK-TRACKING ALGORITHM FOR SURFACE EVOLUTION UNDER REACTIVE-ION ETCHING, Journal of applied physics, 74(8), 1993, pp. 5172-5184
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
74
Issue
8
Year of publication
1993
Pages
5172 - 5184
Database
ISI
SICI code
0021-8979(1993)74:8<5172:ASAFSE>2.0.ZU;2-E
Abstract
A new algorithm that determines the evolution of a surface eroding und er reactive-ion etching is presented. The surface motion is governed b y both the Hamilton-Jacobi equation and the entropy condition for a gi ven etch rate. The trajectories of ''shocks'' and ''rarefaction waves' ' are then directly tracked, and thus this method may be regarded as a generalization of the method of characteristics. This allows slope di scontinuities to be accurately calculated without artificial diffusion . The algorithm is compared with ''geometric'' surface evolution metho ds, such as the line-segment method.