STEADY-STATE TEMPERATURE PROFILE FOR A THIN-FILM RESISTOR UNDER BIAS - RESPONSE

Authors
SABETI R CHARLSON EM CHARLSON EJ
Citation
R. Sabeti et al., STEADY-STATE TEMPERATURE PROFILE FOR A THIN-FILM RESISTOR UNDER BIAS - RESPONSE, Journal of applied physics, 74(8), 1993, pp. 5291-5291
Citations number
NO
Categorie Soggetti
Physics, Applied
Journal title
Journal of applied physics → ACNP
ISSN journal
00218979
Volume
74
Issue
8
Year of publication
1993
Pages
5291 - 5291
Database
ISI
SICI code
0021-8979(1993)74:8<5291:STPFAT>2.0.ZU;2-J
Abstract
Although the thermal conductivities of silicon and silicon dioxide do vary with temperature, minimal change would result from a temperature rise of 50-degrees-C, from room temperature to 350-degrees-C. as is th e case in the application in question.