Ds. Bai et Yr. Chun, NONPARAMETRIC INFERENCES FOR RAMP STRESS TESTS UNDER RANDOM CENSORING, Reliability engineering & systems safety, 41(3), 1993, pp. 217-223
Citations number
21
Categorie Soggetti
Engineering,"Operatione Research & Management Science
This paper considers nonparametric estimation of lifetime distribution
of a product under ramp stress accelerated life tests in which the st
ress on an item increases linearly with time and observations are rand
omly censored. Assuming that a cumulative exposure model holds, the li
fetime distribution of an item under ramp stress is derived. Three non
parametric estimators of the lifetime distribution at use condition st
ress are obtained for the situation where the time transformation func
tion relating stress to lifetime distributions of a test item is a ver
sion of the inverse power law. The proposed estimators are robust to u
nderlying lifetime distribution and are computed in closed form. They
are compared with maximum likelihood estimator for small samples under
exponential lifetime distribution. The method is extended to the case
of competing risks.