An objective method has been developed for measuring the minimum resol
vable temperature difference (MRTD) of infrared imaging systems employ
ing focal plane detector arrays. The resulting MRTD is uniquely determ
ined by applying discrete Fourier analysis, thus avoiding the previous
multi-valued problem associated with the non-isoplanatic property of
discrete devices. The derivation is based on sinusoidal wave input tar
gets but a practical measuring procedure has been developed using conv
entional bar patterns; alternatively the MRTD may be calculated by mea
suring the MTF using the line spread function.