MONTE-CARLO SIMULATION OF X-RAY-ABSORPTION AND ELECTRON-DRIFT IN GASEOUS XENON

Citation
Thvt. Dias et al., MONTE-CARLO SIMULATION OF X-RAY-ABSORPTION AND ELECTRON-DRIFT IN GASEOUS XENON, Physical review. A, 48(4), 1993, pp. 2887-2902
Citations number
85
Categorie Soggetti
Physics
Journal title
ISSN journal
10502947
Volume
48
Issue
4
Year of publication
1993
Pages
2887 - 2902
Database
ISI
SICI code
1050-2947(1993)48:4<2887:MSOXAE>2.0.ZU;2-R
Abstract
A detailed Monte Carlo simulation model has been developed to study th e absorption of soft x rays and the subsequent behavior of the resulti ng electrons under the influence of an applied electric field in gaseo us xenon. All relevant physical processes are included from the initia l photoionization through the subsequent decay of the residual ion to the scattering and drift of the electrons resulting from the interacti ons with the background gas. Details are provided for the cross sectio ns and decay rates employed as well as the criteria used to terminate the simulation, depending on the information or results required. Exam ples of its use in modeling gaseous radiation detectors are included.