A detailed Monte Carlo simulation model has been developed to study th
e absorption of soft x rays and the subsequent behavior of the resulti
ng electrons under the influence of an applied electric field in gaseo
us xenon. All relevant physical processes are included from the initia
l photoionization through the subsequent decay of the residual ion to
the scattering and drift of the electrons resulting from the interacti
ons with the background gas. Details are provided for the cross sectio
ns and decay rates employed as well as the criteria used to terminate
the simulation, depending on the information or results required. Exam
ples of its use in modeling gaseous radiation detectors are included.