D. Aurbach et al., SPECTROSCOPIC STUDIES OF LITHIUM IN AN ULTRAHIGH-VACUUM SYSTEM, Journal of electroanalytical chemistry [1992], 358(1-2), 1993, pp. 63-76
The surface films formed on lithium in dimethoxyethane (DME) and LiAsF
6 solution in DME were investigated using X-ray photoelectron spectros
copy (XPS) and Auger electron spectroscopy (AES) in an ultrahigh vacuu
m (UHV) system. Fresh Li surfaces in DME were prepared under UHV condi
tions by Argon sputtering of bulk lithium followed by immersion in the
solution phase (under Argon), and characterization by the above spect
roscopies, all within the UHV transfer system. It was found that the s
urface layers formed on Li in DME contain Li methoxide and LiOH or Li2
O species (attributed to water reduction). When LiAsF6 was present, th
e surface films also contained LiF. Depth profiling by Argon sputterin
g and AES measurements seem to be consistent with a bilayer structure
of the surface films in which the oxide-hydroxide layer is abuts the L
i surface and solvent reduction species comprise the outer part of the
film.