X-RAY PHOTOELECTRON-SPECTROSCOPY USING A FOCUSED-LASER-PRODUCED PLASMA X-RAY-BEAM

Authors
AOKI S OHCHI T SUDO S NAKAJIMA K ONUKI T SUGISAKI K
Citation
S. Aoki et al., X-RAY PHOTOELECTRON-SPECTROSCOPY USING A FOCUSED-LASER-PRODUCED PLASMA X-RAY-BEAM, JPN J A P 2, 32(10B), 1993, pp. 120001574-120001576
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS → ACNP
Volume
32
Issue
10B
Year of publication
1993
Pages
120001574 - 120001576
Database
ISI
SICI code
Abstract
The observation of X-ray photoelectrons induced by laser-produced plas ma X-rays has been made for the very first time. Aluminum plasma X-ray s were monochromatized to 5.25 nm (236 eV) using a multilayer mirror a nd focused to 50 mum x 70 mum by the Wolter type-I mirror. Au(4f) and SiO2(2p) photoelectrons were observed with the hemispherical electrost atic electron energy analyzer. The multichannel detector has been used to detect the pulse photoelectrons of the required energy bands indiv idually.