Y. Suzaki et al., STRUCTURE AND QUANTUM-SIZE EFFECT OF A-SI(H) A-SIC(H) MULTILAYER FILMS/, Journal of magnetism and magnetic materials, 126(1-3), 1993, pp. 22-24
The presence of artificial superstructures in sputtered a-Si(:H)/a-SiC
(:H) multilayer films was confirmed by optical microscopy. Bragg peaks
up to 23rd order identified in the X-ray diffraction patterns were in
terpreted by an extended step model. The quantum size effect of the op
tical gap was explained by a simple quantum well model.